Scanning Probe Microscopy (SPM)

Scanning probe microscopy covers several related technologies for imaging and measuring surfaces on a fine scale, down to the level of molecules and groups of atoms.

At the other end of the scale, a scan may cover a distance of over 100 micrometers in the x and y directions and 4 micrometers in the z direction. This is an enormous range. It can truly be said that the development of this technology is a major achievement, for it is having profound effects on many areas of science and engineering.

SPM technologies share the concept of scanning an extremely sharp tip (3-50 nm radius of curvature) across the object surface. The tip is mounted on a flexible cantilever, allowing the tip to follow the surface profile (see Figure).
When the tip moves in proximity to the investigated object, forces of interaction between the tip and the surface influence the movement of the cantilever. These movements are detected by selective sensors. Various interactions can be studied depending on the mechanics of the probe
Source Link :http://www.mobot.org/jwcross/spm/

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